https://www.chinmax.com.tw/analysis04.html
CHINMAX PRODUCT
中茂儀器股份有限公司 代理經銷各種膜厚測試儀器
乾燥製程設備、 環境測試設備、腐蝕試驗設備、 各種泛用型儀器
IRAffinity-1S
- **採用高能量陶瓷光源、高通量光學元件、高敏感度DLATGS檢測器 (S/N Ratio:30,000:1)。
- **內置標準的動態校正(ADA)系統及高效自動電子除濕裝置,具備自我診斷功能和狀態監視器,遵照JP/EP/ASTM的有效性。
- **撘配操作簡易的 FTIR軟體IR Solution,支持FDA21CFR Part II。
機型規格表
| Wave number range | 7,800 to 350 cm-1 |
|---|---|
| Resolution | 0.5, 1, 2, 4, 8, or 16 cm-1 |
| S/N ratio | 30,000:1 or higher (peak-to-peak, 4 cm-1 resolution, in a neighborhood of 2,100 cm-1, 1-minute accumulation) |
| Dimensions | 514(W) x 606(D) x 273(H) mm |
| Weight | 35 kg |
※(注) 規格如有更改恕不另行通知。
應用分析
【Automobiles】
- **Material identification tests
- **Analysis of contaminant
- **Failure analysis
【Chemicals and Polymers】
- **Raw material identification tests
- **Qualitative analysis of plasticsand rubber
- **Identification of functional groups of synthetic products
- **Analysis of surface preparation agents
- **Analysis and thickness measurement of thin films
- **Analysis of catalysts
- **Analysis of paints and coatings
- **Analysis of contaminant
- **Quantitative analysis
【Food Products】
- **Raw material identification tests
- **Packaging material identification tests
- **Analysis of contaminant
【Medicine】
- **Raw material identification tests
- **Identification of functional groups of synthetic products
- **Identification of functional groups of natural products
- **Analysis of contaminant
【Metals】
- **Qualitative analysis of thin films on metal plates
- **Analysis and thickness measurement of thin films
- **Analysis of contaminant
【Electricity, Electronics and Semiconductors】
- **Thickness measurement of epitaxial films
- **Quantitative analysis of interstitial oxygen and substituted carbon
- **Quantitative analysis of phosphorus and boron in BPGS
- **Quantitative analysis of hydrogen concentration in nitride film
- **Quantitative analysis of hydrogen concentration in amorphous silicon
- **Detection of brominated flame retardants
- **Analysis of thin films
- **Analysis of contaminant
- **Failure analysis
- **Analysis of semiconductor gases
【Construction】
- **Material identification tests
- **Degradation analysis of coatings
【Cosmetics】
- **Material identification tests
- **Analysis of contaminant
- **Failure analysis

